Discover the latest news, projects, and technological developments from Delong Instruments. Here, we share updates about our products, company events, and interesting topics from the world of electron microscopy.
Patent for LVEM 25E
11. 8. 2026
LVEM 25E has received patent protection in Europe, Japan, and South Korea. The patented technology supports Delong’s unique approach to low-voltage electron microscopy, combining strong image contrast, compact design, and easy operation.