Another patent milestone for LVEM 25E. We are proud to share that LVEM 25E has been granted patent protection through the European Unitary Patent system, as well as in Japan and South Korea. The patented technology supports Delong’s unique approach to low-voltage electron microscopy — combining strong image contrast, compact design, and user-friendly operation. With LVEM 25E, high-quality electron microscopy becomes more accessible to laboratories worldwide.
